Polarizing Microscope Observation for Thin Film of Hole Transport Material -Effect of Evaporation Temperature and Deposition Rate-
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ژورنال
عنوان ژورنال: IEEJ Transactions on Fundamentals and Materials
سال: 2001
ISSN: 0385-4205,1347-5533
DOI: 10.1541/ieejfms1990.121.7_672